 ALMSCO International Unveils New BenchTOF-dx™ Mass Spectrometer Offering Up to 100x Improved Sensitivity
25 Jan 2010 ALMSCO International today announced that it will showcase its new state-of-the-art BenchTOF-dx™ mass spectrometer for the first time at PITTCON 2010. Unlike conventional technology, the new compact reflectron time-of-flight (TOF) instrument is specifically designed to generate truly classical electron impact ionization (EI) spectra for gas chromatography (GC) and comprehensive GCxGC applications. The innovative new system will be unveiled on booth 1806/1807 at PITTCON 2010, February 28 - March 5, Orlando, Florida. The BenchTOF-dx enhances the benefits of standard TOF mass spectrometers, making it perfect for historically challenging compounds. The instrument’s breakthrough capability to generate classical spectra enables laboratories with proprietary spectral libraries to harness the performance benefits of TOF mass spectrometry while...
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